Extraction of Process Variation Parameters in FinFET Technology Based on Compact Modeling and Characterization

出版年份 2018 全文链接

标题

作者

关键词

出版物

Volume 65, Issue 3, Pages 847-854

出版商

Institute of Electrical and Electronics Engineers (IEEE)

发表日期

2018-01-18

DOI

10.1109/ted.2018.2790083

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