Physical Model for the Steep Subthreshold Slope in Ferroelectric FETs

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作者

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出版物

IEEE ELECTRON DEVICE LETTERS

Volume 39, Issue 6, Pages 877-880

出版商

Institute of Electrical and Electronics Engineers (IEEE)

发表日期

2018-04-24

DOI

10.1109/led.2018.2829604

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IEEE ELECTRON DEVICE LETTERS

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