4.5 Article

Raman spectroscopy characterization of two-dimensional materials

期刊

CHINESE PHYSICS B
卷 27, 期 3, 页码 -

出版社

IOP PUBLISHING LTD
DOI: 10.1088/1674-1056/27/3/037802

关键词

Raman; 2D materials; non-destructive characterization

资金

  1. National Natural Science Foundation of China [11504111, 61574060, 61574056]
  2. Projects of Science and Technology Commission of Shanghai Municipality of China [15JC1401800, 14DZ2260800]
  3. Program for Professor of Special Appointment (Eastern Scholar), Shanghai Rising-Star Program, China [17QA1401400]
  4. Fundamental Research Funds for the Central Universities of China

向作者/读者索取更多资源

Two-dimensional (2D) materials have become a hot study topic in recent years due to their outstanding electronic, optical, and thermal properties. The unique band structures of strong in-plane chemical bonds and weak out-of-plane van der Waals (vdW) interactions make 2D materials promising for nanodevices and various other applications. Raman spectroscopy is a powerful and non-destructive characterization tool to study the properties of 2D materials. In this work, we review the research on the characterization of 2D materials with Raman spectroscopy. In addition, we discuss the application of the Raman spectroscopy technique to semiconductors, superconductivity, photoelectricity, and thermoelectricity.

作者

我是这篇论文的作者
点击您的名字以认领此论文并将其添加到您的个人资料中。

评论

主要评分

4.5
评分不足

次要评分

新颖性
-
重要性
-
科学严谨性
-
评价这篇论文

推荐

暂无数据
暂无数据