Structurally Controlled Large-Area 10 nm Pitch Graphene Nanomesh by Focused Helium Ion Beam Milling

标题
Structurally Controlled Large-Area 10 nm Pitch Graphene Nanomesh by Focused Helium Ion Beam Milling
作者
关键词
-
出版物
ACS Applied Materials & Interfaces
Volume 10, Issue 12, Pages 10362-10368
出版商
American Chemical Society (ACS)
发表日期
2018-02-28
DOI
10.1021/acsami.8b00427

向作者/读者发起求助以获取更多资源

Find Funding. Review Successful Grants.

Explore over 25,000 new funding opportunities and over 6,000,000 successful grants.

Explore

Create your own webinar

Interested in hosting your own webinar? Check the schedule and propose your idea to the Peeref Content Team.

Create Now