4.8 Article

Reduction of Charge Traps and Stability Enhancement in Solution-Processed Organic Field-Effect Transistors Based on a Blended n-Type Semiconductor

期刊

ACS APPLIED MATERIALS & INTERFACES
卷 10, 期 18, 页码 15952-15961

出版社

AMER CHEMICAL SOC
DOI: 10.1021/acsami.8b02851

关键词

n-type; OFET; high stability; semiconductor-dielectric interface; density-of-states

资金

  1. European Research Council (ERC) [StG 2012-306826 e-GAMES]
  2. Generalitat de Catalunya [2017-SGR-918]
  3. Spanish Ministry of Economy and Competitiveness [FANCY CTQ2016-80030-R, ENE2017-87671-C3-2-R, SEV-2015-0496]

向作者/读者索取更多资源

Solution-processed n-type organic field-effect transistors (OFETs) are essential elements for developing large-area, low-cost, and all organic logic/complementary circuits. Nonetheless, the development of air-stable n-type organic semiconductors (OSCs) lags behind their p-type counterparts. The trapping of electrons at the semiconductor dielectric interface leads to a lower performance and operational stability. Herein, we report printed small-molecule n-type OFETs based on a blend with a binder polymer, which enhances the device stability due to the improvement of the semiconductor dielectric interface quality and a self-encapsulation. Both combined effects prevent the fast deterioration of the OSC. Additionally, a complementary metal-oxide semiconductor-like inverter is fabricated depositing p-type and n-type OSCs simultaneously.

作者

我是这篇论文的作者
点击您的名字以认领此论文并将其添加到您的个人资料中。

评论

主要评分

4.8
评分不足

次要评分

新颖性
-
重要性
-
科学严谨性
-
评价这篇论文

推荐

暂无数据
暂无数据