期刊
ACS APPLIED MATERIALS & INTERFACES
卷 10, 期 3, 页码 2230-2235出版社
AMER CHEMICAL SOC
DOI: 10.1021/acsami.7b17224
关键词
oxide; nucleation; transmission electron microscopy; aluminum; high resolution transmission electron microscopy; environmental transmission electron microscopy; electron energy loss spectroscopy
资金
- Engineering and Physical Sciences (EPSRC) U.K [EP/G035954/1, EP/K016946/1]
- Defence Threat Reduction Agency [HDTRA1-12-1-0013]
- U.S. DOE Office of Science Facility, at Brookhaven National Laboratory [DE-SC0012704]
- European Research Council (ERC) under European Union's Horizon research and innovation programme [ERC-2016-STG-EvoluTEM-715502]
- EPSRC [EP/K016946/1, EP/G035954/1, EP/P025021/1, EP/K005014/1] Funding Source: UKRI
- Engineering and Physical Sciences Research Council [EP/R00661X/1, EP/P025021/1, EP/K005014/1, EP/G035954/1, EP/S019367/1, EP/K016946/1] Funding Source: researchfish
The surface oxidation of aluminum is still poorly understood despite its vital role as an insulator in electronics, in aluminum-air batteries, and in protecting the metal against corrosion. Here we use atomic resolution imaging in an environmental transmission electron microscope (TEM) to investigate the mechanism of aluminum oxide formation. Harnessing electron beam sputtering we prepare a pristine, oxide-free metal surface in the TEM. This allows us to study, as a function of crystallographic orientation and oxygen gas pressure, the full oxide growth regime from the first oxide nucleation to a complete saturated, few-nanometers-thick surface film.
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