Scanning Kelvin Probe Microscopy Reveals Planar Defects Are Sources of Electronic Disorder in Organic Semiconductor Crystals
出版年份 2017 全文链接
标题
Scanning Kelvin Probe Microscopy Reveals Planar Defects Are Sources of Electronic Disorder in Organic Semiconductor Crystals
作者
关键词
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出版物
Advanced Electronic Materials
Volume 3, Issue 7, Pages 1700117
出版商
Wiley
发表日期
2017-05-09
DOI
10.1002/aelm.201700117
参考文献
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