Device Physics of Contact Issues for the Overestimation and Underestimation of Carrier Mobility in Field-Effect Transistors
出版年份 2017 全文链接
标题
Device Physics of Contact Issues for the Overestimation and Underestimation of Carrier Mobility in Field-Effect Transistors
作者
关键词
-
出版物
Physical Review Applied
Volume 8, Issue 3, Pages -
出版商
American Physical Society (APS)
发表日期
2017-09-23
DOI
10.1103/physrevapplied.8.034020
参考文献
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