Self-Protected Thermometry with Infrared Photons and Defect Spins in Silicon Carbide

标题
Self-Protected Thermometry with Infrared Photons and Defect Spins in Silicon Carbide
作者
关键词
-
出版物
Physical Review Applied
Volume 8, Issue 4, Pages -
出版商
American Physical Society (APS)
发表日期
2017-10-25
DOI
10.1103/physrevapplied.8.044015

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