Comparison of Models and Whole-Genome Profiling Approaches for Genomic-Enabled Prediction of Septoria Tritici Blotch, Stagonospora Nodorum Blotch, and Tan Spot Resistance in Wheat

标题
Comparison of Models and Whole-Genome Profiling Approaches for Genomic-Enabled Prediction of Septoria Tritici Blotch, Stagonospora Nodorum Blotch, and Tan Spot Resistance in Wheat
作者
关键词
-
出版物
Plant Genome
Volume 10, Issue 2, Pages -
出版商
Crop Science Society of America
发表日期
2017-04-07
DOI
10.3835/plantgenome2016.08.0082

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