Broad ion beam serial section tomography

标题

作者

关键词

3D electron back scattered diffraction, Ion beam polishing, Scanning electron microscopy, Focused ion beam (FIB), Computed tomography (CT), Cermet

出版物

ULTRAMICROSCOPY

Volume 172, Issue -, Pages 52-64

出版商

Elsevier BV

发表日期

2016-11-11

DOI

10.1016/j.ultramic.2016.10.014

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Protocol

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