Inverse gene-for-gene interactions contribute additively to tan spot susceptibility in wheat

标题
Inverse gene-for-gene interactions contribute additively to tan spot susceptibility in wheat
作者
关键词
Quantitative Trait Locus, Quantitative Trait Locus Analysis, Quantitative Trait Locus Mapping, Multiple Interval Mapping, Wheat Recombinant Inbred Line
出版物
THEORETICAL AND APPLIED GENETICS
Volume 130, Issue 6, Pages 1267-1276
出版商
Springer Nature
发表日期
2017-03-15
DOI
10.1007/s00122-017-2886-4

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