High-Resolution Cryo-EM Maps and Models: A Crystallographer's Perspective

出版年份 2017 全文链接

标题

作者

关键词

electron density, cryoelectron microscopy, resolution, structure quality

出版物

Volume 25, Issue 10, Pages 1589-1597.e1

出版商

Elsevier BV

发表日期

2017-09-01

DOI

10.1016/j.str.2017.07.012

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