n-Type Si solar cells with passivating electron contact: Identifying sources for efficiency limitations by wafer thickness and resistivity variation

出版年份 2017 全文链接

标题

作者

关键词

Silicon solar cells, Passivating contacts, Device simulation, Power loss analysis, Impurity recombination

出版物

Volume 173, Issue -, Pages 96-105

出版商

Elsevier BV

发表日期

2017-05-24

DOI

10.1016/j.solmat.2017.05.042

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