XPS study of OH impurity in solution processed CdS thin films

标题

作者

关键词

CdS thin film, Chemical bath deposition, Hydroxide incorporation, Thermal annealing, Mechanism of changes in CdS properties

出版物

Volume 160, Issue -, Pages 211-216

出版商

Elsevier BV

发表日期

2016-11-01

DOI

10.1016/j.solmat.2016.10.040

联系作者

Explore over 25,000 new funding opportunities and over 6,000,000 successful grants.

Explore

Interested in hosting your own webinar? Check the schedule and propose your idea to the Peeref Content Team.

Create Now