A literature review on planning and analysis of accelerated testing for reliability assessment
出版年份 2017 全文链接
标题
A literature review on planning and analysis of accelerated testing for reliability assessment
作者
关键词
-
出版物
QUALITY AND RELIABILITY ENGINEERING INTERNATIONAL
Volume 33, Issue 8, Pages 2361-2383
出版商
Wiley
发表日期
2017-07-21
DOI
10.1002/qre.2195
参考文献
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注意:仅列出部分参考文献,下载原文获取全部文献信息。- Optimal Design of Step-stress Accelerated Degradation Test with Multiple Stresses and Multiple Degradation Measures
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- More Pitfalls of Accelerated Tests
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- Optimal Two-Variable Accelerated Degradation Test Plan for Gamma Degradation Processes
- (2016) Tzong-Ru Tsai et al. IEEE TRANSACTIONS ON RELIABILITY
- Optimal Time-Censored Constant-Stress ALT Plan Based on Chord of Nonlinear Stress-Life Relationship
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- Optimal sample size allocation for accelerated life test under progressive type-II censoring with competing risks
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- Design of Equivalent Accelerated Life Testing Plans under Different Stress Applications
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- Optimal Design for Accelerated Destructive Degradation Tests
- (2016) Chih-Chun Tsai et al. Quality Technology and Quantitative Management
- Optimal Decisions on the Accelerated Degradation Test Plan Under the Wiener Process
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- Optimum step-stress accelerated degradation test for Wiener degradation process under constraints
- (2015) Cheng-Hung Hu et al. EUROPEAN JOURNAL OF OPERATIONAL RESEARCH
- Reliability demonstration methodology for products with Gamma Process by optimal accelerated degradation testing
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- Optimum Partially Accelerated Life Test Plans with Progressively Type I Interval-Censored Data
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- Equivalent accelerated life testing plans for log-location-scale distributions
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- Stochastic modelling and analysis of degradation for highly reliable products
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- Statistical Inference of Accelerated Life Testing With Dependent Competing Failures Based on Copula Theory
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- Best Constant-Stress Accelerated Life-Test Plans With Multiple Stress Factors for One-Shot Device Testing Under a Weibull Distribution
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- Accelerated Degradation Test Planning Using the Inverse Gaussian Process
- (2014) Zhi-Sheng Ye et al. IEEE TRANSACTIONS ON RELIABILITY
- Optimal design of accelerated life tests for an extension of the exponential distribution
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- Designing a Degradation Test with a Two-Parameter Exponential Lifetime Distribution
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- Planning Accelerated Life Tests Under Scheduled Inspections for Log-Location-Scale Distributions
- (2013) Xiao Liu et al. IEEE TRANSACTIONS ON RELIABILITY
- A Novel Approach to Optimal Accelerated Life Test Planning With Interval Censoring
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- Design of statistically and energy-efficient accelerated life testing experiments
- (2013) Dan Zhang et al. IIE TRANSACTIONS
- Design of accelerated life testing plans under multiple stresses
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- Overview of Reliability Testing
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- Optimal Design for Degradation Tests Based on Gamma Processes With Random Effects
- (2012) Chih-Chun Tsai et al. IEEE TRANSACTIONS ON RELIABILITY
- Design of accelerated life test plans under progressive Type II interval censoring with random removals
- (2012) Chang Ding et al. JOURNAL OF STATISTICAL COMPUTATION AND SIMULATION
- Lifetime predictions of LED-based light bars by accelerated degradation test
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- Statistical equivalency and optimality of simple step-stress accelerated test plans for the exponential distribution
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- Modeling and Planning of Step-Stress Accelerated Life Tests With Independent Competing Risks
- (2011) Xiao Liu et al. IEEE TRANSACTIONS ON RELIABILITY
- Accelerated Destructive Degradation Tests Robust to Distribution Misspecification
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- Planning Simple Step-Stress Accelerated Life Tests Using Bayesian Methods
- (2011) Tao Yuan et al. IEEE TRANSACTIONS ON RELIABILITY
- Bayesian Methods for Accelerated Destructive Degradation Test Planning
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- Multiple-Steps Step-Stress Accelerated Degradation Modeling Based on Wiener and Gamma Processes
- (2010) Zhengqiang Pan et al. COMMUNICATIONS IN STATISTICS-SIMULATION AND COMPUTATION
- Accelerated Life Test Plans for Predicting Warranty Cost
- (2010) Guangbin Yang IEEE TRANSACTIONS ON RELIABILITY
- Accelerated Life Test Plans for Repairable Systems With Multiple Independent Risks
- (2010) Xiao Liu et al. IEEE TRANSACTIONS ON RELIABILITY
- Progressive-Stress Accelerated Degradation Test for Highly-Reliable Products
- (2010) Chien-Yu Peng et al. IEEE TRANSACTIONS ON RELIABILITY
- A Tool for Evaluating Time-Varying-Stress Accelerated Life Test Plans With Log-Location-Scale Distributions
- (2010) Yili Hong et al. IEEE TRANSACTIONS ON RELIABILITY
- Optimal design of accelerated degradation tests based on Wiener process models
- (2010) Heonsang Lim et al. JOURNAL OF APPLIED STATISTICS
- Optimal bivariate step-stress accelerated life test for Type-I hybrid censored data
- (2010) Li Ling et al. JOURNAL OF STATISTICAL COMPUTATION AND SIMULATION
- Planning sequential constant-stress accelerated life tests with stepwise loaded auxiliary acceleration factor
- (2010) Xiao Liu et al. JOURNAL OF STATISTICAL PLANNING AND INFERENCE
- Degradation of AlInGaP red LEDs under drive current and temperature accelerated life tests
- (2010) M. Vázquez et al. MICROELECTRONICS RELIABILITY
- A Bayesian optimal design for accelerated degradation tests
- (2010) Xiao Liu et al. QUALITY AND RELIABILITY ENGINEERING INTERNATIONAL
- Optimal Step-Stress Accelerated Degradation Test Plan for Gamma Degradation Processes
- (2009) Sheng-Tsaing Tseng et al. IEEE TRANSACTIONS ON RELIABILITY
- RETRACTED ARTICLE: Optimal planning of failure-step stress partially accelerated life tests under type-II censoring
- (2009) Ali A. Ismail et al. JOURNAL OF STATISTICAL COMPUTATION AND SIMULATION
- Accelerated life test sampling plans for the Weibull distribution under Type I progressive interval censoring with random removals
- (2009) Chang Ding et al. JOURNAL OF STATISTICAL COMPUTATION AND SIMULATION
- Accelerated life test planning with independent lognormal competing risks
- (2009) Francis Pascual JOURNAL OF STATISTICAL PLANNING AND INFERENCE
- Design of accelerated life test sampling plans with a nonconstant shape parameter
- (2008) J.H. Seo et al. EUROPEAN JOURNAL OF OPERATIONAL RESEARCH
- Accelerated Life Test Planning With Independent Weibull Competing Risks
- (2008) F. Pascual IEEE TRANSACTIONS ON RELIABILITY
- Optimal step-stress testing for progressively Type-I censored data from exponential distribution
- (2008) N. Balakrishnan et al. JOURNAL OF STATISTICAL PLANNING AND INFERENCE
- Optimal simple step stress accelerated life test design for reliability prediction
- (2008) Nasser Fard et al. JOURNAL OF STATISTICAL PLANNING AND INFERENCE
- Optimum step-stress accelerated life test plans for log-location-scale distributions
- (2008) Haiming Ma et al. NAVAL RESEARCH LOGISTICS
- Optimal design of accelerated life testing plans for periodical replacement with penalty
- (2008) Haitao Liao NAVAL RESEARCH LOGISTICS
- Optimal accelerated life tests under interval censoring with random removals: the case of Weibull failure distribution
- (2008) Siu-Keung Tse et al. STATISTICS
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