Defect concentration in nitrogen-doped graphene grown on Cu substrate: A thickness effect

出版年份 2017 全文链接

标题

作者

关键词

Graphene, CVD, High Resolution-X-ray Photoelectron Spectroscopy (HR-XPS), Raman, Defects, Nitrogen-doping

出版物

Volume 513, Issue -, Pages 62-68

出版商

Elsevier BV

发表日期

2017-03-02

DOI

10.1016/j.physb.2017.03.004

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