Imaging of near-field interference patterns by aperture-type SNOM – influence of illumination wavelength and polarization state

标题
Imaging of near-field interference patterns by aperture-type SNOM – influence of illumination wavelength and polarization state
作者
关键词
-
出版物
OPTICS EXPRESS
Volume 25, Issue 14, Pages 16560
出版商
The Optical Society
发表日期
2017-07-06
DOI
10.1364/oe.25.016560

向作者/读者发起求助以获取更多资源

Become a Peeref-certified reviewer

The Peeref Institute provides free reviewer training that teaches the core competencies of the academic peer review process.

Get Started

Ask a Question. Answer a Question.

Quickly pose questions to the entire community. Debate answers and get clarity on the most important issues facing researchers.

Get Started