Measurement of charge carrier mobilities in thin films on metal substrates by reflection time resolved terahertz spectroscopy

标题
Measurement of charge carrier mobilities in thin films on metal substrates by reflection time resolved terahertz spectroscopy
作者
关键词
-
出版物
OPTICS EXPRESS
Volume 25, Issue 15, Pages 17227
出版商
The Optical Society
发表日期
2017-07-12
DOI
10.1364/oe.25.017227

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