Measuring true localization accuracy in super resolution microscopy with DNA-origami nanostructures

标题
Measuring true localization accuracy in super resolution microscopy with DNA-origami nanostructures
作者
关键词
-
出版物
NEW JOURNAL OF PHYSICS
Volume 19, Issue 2, Pages 025013
出版商
IOP Publishing
发表日期
2017-02-09
DOI
10.1088/1367-2630/aa5f74

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