Atomic force microscopy with nanoelectrode tips for high resolution electrochemical, nanoadhesion and nanoelectrical imaging

标题
Atomic force microscopy with nanoelectrode tips for high resolution electrochemical, nanoadhesion and nanoelectrical imaging
作者
关键词
-
出版物
NANOTECHNOLOGY
Volume 28, Issue 9, Pages 095711
出版商
IOP Publishing
发表日期
2017-01-31
DOI
10.1088/1361-6528/aa5839

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