General criterion to distinguish between Schottky and Ohmic contacts at the metal/two-dimensional semiconductor interface

标题
General criterion to distinguish between Schottky and Ohmic contacts at the metal/two-dimensional semiconductor interface
作者
关键词
-
出版物
Nanoscale
Volume 9, Issue 5, Pages 2068-2073
出版商
Royal Society of Chemistry (RSC)
发表日期
2017-01-06
DOI
10.1039/c6nr07937g

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