4.8 Article

In situ atomic-scale analysis of Rayleigh instability in ultrathin gold nanowires

期刊

NANO RESEARCH
卷 11, 期 2, 页码 625-632

出版社

TSINGHUA UNIV PRESS
DOI: 10.1007/s12274-017-1667-3

关键词

ultrathin gold nanowire; in situ transmission electron microscopy (TEM); Rayleigh instability; thermal instability; interconnect

资金

  1. Research Grants Council of the Hong Kong Special Administrative Region, China [CityU 11209914]
  2. National Natural Science Foundation of China [51301147]
  3. Innovation and Technology Commission via the Hong Kong Branch of National Precious Metals Material Engineering Research Center
  4. NATIONAL INSTITUTE OF DIABETES AND DIGESTIVE AND KIDNEY DISEASES [DP2DK111910] Funding Source: NIH RePORTER

向作者/读者索取更多资源

Comprehensive understanding of the structural/morphology stability of ultrathin (diameter < 10 nm) gold nanowires under real service conditions (such as under Joule heating) is a prerequisite for the reliable implementation of these emerging building blocks into functional nanoelectronics and mechatronics systems. Here, by using the in situ transmission electron microscopy (TEM) technique, we discovered that the Rayleigh instability phenomenon exists in ultrathin gold nanowires upon moderate heating. Through the controlled electron beam irradiation-induced heating mechanism (with < 100 degrees C temperature rise), we further quantified the effect of electron beam intensity and its dependence on Rayleigh instability in altering the geometry and morphology of the ultrathin gold nanowires. Moreover, in situ high-resolution TEM (HRTEM) observations revealed surface atomic diffusion process to be the dominating mechanism for the morphology evolution processes. Our results, with unprecedented details on the atomic-scale picture of Rayleigh instability and its underlying physics, provide critical insights on the thermal/structural stability of gold nanostructures down to a sub-10 nm level, which may pave the way for their interconnect applications in future ultra-large-scale integrated circuits.

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