Level Spectrum and Charge Relaxation in a Silicon Double Quantum Dot Probed by Dual-Gate Reflectometry

标题
Level Spectrum and Charge Relaxation in a Silicon Double Quantum Dot Probed by Dual-Gate Reflectometry
作者
关键词
-
出版物
NANO LETTERS
Volume 17, Issue 2, Pages 1001-1006
出版商
American Chemical Society (ACS)
发表日期
2017-01-13
DOI
10.1021/acs.nanolett.6b04354

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