Measurement Error in Atomic-Scale Scanning Transmission Electron Microscopy—Energy-Dispersive X-Ray Spectroscopy (STEM-EDS) Mapping of a Model Oxide Interface

标题
Measurement Error in Atomic-Scale Scanning Transmission Electron Microscopy—Energy-Dispersive X-Ray Spectroscopy (STEM-EDS) Mapping of a Model Oxide Interface
作者
关键词
-
出版物
MICROSCOPY AND MICROANALYSIS
Volume 23, Issue 03, Pages 513-517
出版商
Cambridge University Press (CUP)
发表日期
2017-04-05
DOI
10.1017/s1431927617000368

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