Nanoscale analysis of clustered DNA damage after high-LET irradiation by quantitative electron microscopy – The heavy burden to repair
作者
关键词
Double-strand breaks (DSBs), Single-strand breaks (SSBs), Linear energy transfer (LET), High-LET irradiation, Non-homologous end-joining (NHEJ), Ku-heterodimer, Transmission electron microscopy (TEM)
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