期刊
JOURNAL OF PHYSICS-CONDENSED MATTER
卷 29, 期 38, 页码 -出版社
IOP PUBLISHING LTD
DOI: 10.1088/1361-648X/aa7dc8
关键词
four-probe STM; XPS; ZnO; surface modification; resistivity; oxygen; hydrogen
资金
- Ser Cymru II fellowship scheme - European Regional Development Fund through the Welsh Government
- Royal Society of New Zealand
- Ser Cymru National Research Network in Advance Engineering and Materials [NRN150]
- Welsh Government Ser Cymru Programme
- Robert A Welch Foundation [C-0002]
- Engineering and Physical Sciences Research Council [EP/K504002/1]
- Engineering and Physical Sciences Research Council [EP/K504002/1] Funding Source: researchfish
Multi-probe instruments based on scanning tunnelling microscopy (STM) are becoming increasingly common for their ability to perform nano-to atomic-scale investigations of nanostructures, surfaces and in situ reactions. A common configuration is the four-probe STM often coupled with in situ scanning electron microscopy (SEM) that allows precise positioning of the probes onto surfaces and nanostructures enabling electrical and scanning experiments to be performed on highly localised regions of the sample. In this paper, we assess the sensitivity of four-probe STM for in-line resistivity measurements of the bulk ZnO surface. The measurements allow comparisons to established models that are used to relate light plasma treatments (O and H) of the surfaces to the resistivity measurements. The results are correlated to x-ray photoelectron spectroscopy (XPS) and show that four-probe STM can detect changes in surface and bulk conduction mechanisms that are beyond conventional monochromatic XPS.
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