A MEMS Tensile Testing Technique for Measuring True Activation Volume and Effective Stress in Nanocrystalline Ultrathin Microbeams

出版年份 2017 全文链接

标题

作者

关键词

出版物

Volume 26, Issue 5, Pages 1082-1092

出版商

Institute of Electrical and Electronics Engineers (IEEE)

发表日期

2017-06-09

DOI

10.1109/jmems.2017.2708522

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