Determination of partial dislocations of stacking fault in (111) single crystal diamond grown on (111) seed crystal by synchrotron X-ray topography

出版年份 2017 全文链接

标题

作者

关键词

X-ray topography, Defect, Single crystal growth, Diamond

出版物

JOURNAL OF CRYSTAL GROWTH

Volume 468, Issue -, Pages 439-442

出版商

Elsevier BV

发表日期

2016-11-24

DOI

10.1016/j.jcrysgro.2016.11.094

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