Resistive switching behavior in copper doped zinc oxide (ZnO:Cu) thin films studied by using scanning probe microscopy techniques

标题
Resistive switching behavior in copper doped zinc oxide (ZnO:Cu) thin films studied by using scanning probe microscopy techniques
作者
关键词
Resistive switching, Polarization switching, conductive Atomic Force Microscopy, Piezoresponse Force Microscopy, ZnO:Cu thin film
出版物
JOURNAL OF ALLOYS AND COMPOUNDS
Volume 709, Issue -, Pages 535-541
出版商
Elsevier BV
发表日期
2017-03-18
DOI
10.1016/j.jallcom.2017.03.169

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