Advanced techniques for characterization of ion beam modified materials

标题

作者

关键词

Rutherford backscattering spectrometry, Raman spectroscopy, X-ray diffraction, Small-angle X-ray scattering, Positron annihilation spectroscopy, Ion beam modification

出版物

CURRENT OPINION IN SOLID STATE & MATERIALS SCIENCE

Volume 19, Issue 1, Pages 19-28

出版商

Elsevier BV

发表日期

2014-10-30

DOI

10.1016/j.cossms.2014.09.007

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