Spetroscopic ellipsometry study on electrical and elemental properties of Sb-doped ZnO thin films

标题
Spetroscopic ellipsometry study on electrical and elemental properties of Sb-doped ZnO thin films
作者
关键词
Spectroscopic ellipsometry, DIBSD, SZO, XPS, XRD
出版物
CURRENT APPLIED PHYSICS
Volume 15, Issue 4, Pages 479-485
出版商
Elsevier BV
发表日期
2015-02-07
DOI
10.1016/j.cap.2015.02.008

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