Atom-Based RF Electric Field Metrology: From Self-Calibrated Measurements to Subwavelength and Near-Field Imaging

出版年份 2017 全文链接

标题

作者

关键词

出版物

Volume 59, Issue 2, Pages 717-728

出版商

Institute of Electrical and Electronics Engineers (IEEE)

发表日期

2017-01-11

DOI

10.1109/temc.2016.2644616

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