Bending Stress Induced Performance Change in Plastic Oxide Thin-Film Transistor and Recovery by Annealing at 300 °C

出版年份 2017 全文链接

标题

作者

关键词

出版物

Volume 38, Issue 8, Pages 1035-1038

出版商

Institute of Electrical and Electronics Engineers (IEEE)

发表日期

2017-06-28

DOI

10.1109/led.2017.2718565

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