Impact of Parasitic Capacitance and Ferroelectric Parameters on Negative Capacitance FinFET Characteristics

出版年份 2017 全文链接

标题

作者

关键词

出版物

Volume 38, Issue 1, Pages 142-144

出版商

Institute of Electrical and Electronics Engineers (IEEE)

发表日期

2016-11-15

DOI

10.1109/led.2016.2628349

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