Measuring thin films using quantitative frustrated total internal reflection (FTIR)

标题
Measuring thin films using quantitative frustrated total internal reflection (FTIR)
作者
关键词
Tips and Tricks
出版物
EUROPEAN PHYSICAL JOURNAL E
Volume 40, Issue 5, Pages -
出版商
Springer Nature
发表日期
2017-05-05
DOI
10.1140/epje/i2017-11542-4

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