期刊
JOURNAL OF SYNCHROTRON RADIATION
卷 23, 期 -, 页码 769-776出版社
INT UNION CRYSTALLOGRAPHY
DOI: 10.1107/S1600577516003969
关键词
single-shot XAFS; time resolution; spatial resolution; divergent XAFS
A new concept that comprises both time-and lateral-resolved X-ray absorption fine-structure information simultaneously in a single shot is presented. This uncomplicated set-up was tested at the BAMline at BESSY-II (Berlin, Germany). The primary broadband beam was generated by a double multilayer monochromator. The transmitted beam through the sample is diffracted by a convexly bent Si (111) crystal, producing a divergent beam. This, in turn, is collected by either an energy-sensitive area detector, the so-called color X-ray camera, or by an area-sensitive detector based on a CCD camera, in theta-2 theta geometry. The first tests were performed with thin metal foils and some iron oxide mixtures. A time resolution of lower than 1 s together with a spatial resolution in one dimension of at least 50 mm is achieved.
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