An Effective Approach for the Identification of Carrier Type and Local Inversion Doping in Graphene by Biased Atomic Force Microscopy
出版年份 2016 全文链接
标题
An Effective Approach for the Identification of Carrier Type and Local Inversion Doping in Graphene by Biased Atomic Force Microscopy
作者
关键词
-
出版物
Advanced Electronic Materials
Volume 2, Issue 4, Pages 1500255
出版商
Wiley
发表日期
2016-02-04
DOI
10.1002/aelm.201500255
参考文献
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