期刊
ACS PHOTONICS
卷 3, 期 7, 页码 1308-1314出版社
AMER CHEMICAL SOC
DOI: 10.1021/acsphotonics.6b00286
关键词
lattice distortion; second-harmonic generation; polarization-dependent; ZnO nanowires
类别
资金
- 973 Programs [2014CB921301]
- National Natural Science Foundation of China [11204097]
- Ministry of Education of China [20130142110078]
- Fundamental Research Funds for the Central Universities [HUST: 2016YXMS015]
We demonstrate a highly sensitive detection of the lattice distortion in single bent ZnO nanowires (NWs) by second-harmonic generation (SHG) microscopy. As the curvature of the single bent ZnO NW increases to 21 mm(-1) (<4% bending distortion), it shows a significant decrease (similar to 70%) in the SHG intensity ratio between perpendicular and parallel excitation polarization with respect to c-axis of ZnO NWs. A high detection sensitivity of 10(-3) nm on the bending distortion is obtained in our experiment. Importantly, the extraordinary nonaxisymmetrical SHG polarimetric patterns are also observed, indicating the twisting distortion around c-axis of ZnO NWs. Thus, SHG microscopy provides a sensitive all-optical and noninvasive method for in situ detecting the lattice distortion under various circumstances.
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