Direct imaging of defect formation in strained organic flexible electronics by Scanning Kelvin Probe Microscopy
出版年份 2016 全文链接
标题
Direct imaging of defect formation in strained organic flexible electronics by Scanning Kelvin Probe Microscopy
作者
关键词
-
出版物
Scientific Reports
Volume 6, Issue 1, Pages -
出版商
Springer Nature
发表日期
2016-12-02
DOI
10.1038/srep38203
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