期刊
IEEE PHOTONICS JOURNAL
卷 8, 期 5, 页码 -出版社
IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
DOI: 10.1109/JPHOT.2016.2607687
关键词
GeSn; photodetector; short-wave infrared (SWIR) imaging
资金
- Major State Basic Research Development Program of China [2013CB632103]
- National Natural Science Foundation [61377045, 61435013, 61534005, 61604146]
- Beijing Natural Science Foundation [4162063]
We reported an investigation of GeSn-based p-i-n photodetectors (PDs) with a Ge0.92Sn0.08 active layer grown on n-type Si (100) substrate using molecular beam epitaxy (MBE). The GeSn photodetector achieved a wide spectrum detection whose cutoff wavelength can reach to 2.3 mu m. The PDs exhibited a high performance near 2.0 mu m with a responsivity of 93 mA/W and a dark current of 171 mu A under a reverse bias of 1 V at room temperature. This work represented a promising technology to develop Si-based short-wave infrared (SWIR) photodetectors.
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