Characterization of a polyethylene–polyamide multilayer film using nanoscale infrared spectroscopy and imaging

出版年份 2016 全文链接

标题

作者

关键词

Infrared, Atomic force microscopy, Multilayer films, Tie layers, Polyethylene, Polyamide

出版物

Volume 82, Issue -, Pages 10-15

出版商

Elsevier BV

发表日期

2015-11-22

DOI

10.1016/j.vibspec.2015.11.004

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