Subset geometric phase analysis method for deformation evaluation of HRTEM images

标题
Subset geometric phase analysis method for deformation evaluation of HRTEM images
作者
关键词
High resolution electron microscopy image, Geometric phase analysis, Strain analysis, Subset
出版物
ULTRAMICROSCOPY
Volume 171, Issue -, Pages 34-42
出版商
Elsevier BV
发表日期
2016-09-09
DOI
10.1016/j.ultramic.2016.08.019

向作者/读者发起求助以获取更多资源

Reprint

联系作者

Discover Peeref hubs

Discuss science. Find collaborators. Network.

Join a conversation

Publish scientific posters with Peeref

Peeref publishes scientific posters from all research disciplines. Our Diamond Open Access policy means free access to content and no publication fees for authors.

Learn More