On the benefit of aberration-corrected HAADF-STEM for strain determination and its application to tailoring ferroelectric domain patterns
作者
关键词
Aberration-corrected scanning transmission electron microscopy, High angle annular dark field (HAADF), Strain determination, Geometrical phase analysis (GPA), Ferroelectric domain structure, PbTiO, 3, films
Find Funding. Review Successful Grants.
Explore over 25,000 new funding opportunities and over 6,000,000 successful grants.
ExploreDiscover Peeref hubs
Discuss science. Find collaborators. Network.
Join a conversation