4.4 Article

The effect of length scale on the determination of geometrically necessary dislocations via EBSD continuum dislocation microscopy

期刊

ULTRAMICROSCOPY
卷 164, 期 -, 页码 1-10

出版社

ELSEVIER
DOI: 10.1016/j.ultramic.2016.03.003

关键词

High resolution EBSD; Continuum dislocation microscopy; EBSD step size; Dislocation density

资金

  1. U.S. Department of Energy (DOE), Office of Science, Basic Energy Sciences (BES) [DE-SC0012587]
  2. National Science Foundation (NSF) [CMMI:14041404771]
  3. Div Of Civil, Mechanical, & Manufact Inn
  4. Directorate For Engineering [1404771] Funding Source: National Science Foundation

向作者/读者索取更多资源

Electron backscatter diffraction (EBSD) dislocation microscopy is an important, emerging field in metals characterization. Currently, calculation of geometrically necessary dislocation (GND) density is problematic because it has been shown to depend on the step size of the EBSD scan used to investigate the sample. This paper models the change in calculated GND density as a function of step size statistically. The model provides selection criteria for EBSD step size as well as an estimate of the total dislocation content. Evaluation of a heterogeneously deformed tantalum specimen is used to asses the method. (C) 2016 Elsevier B.V. All rights reserved.

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