Enhanced the photocatalytic activity of Ni-doped ZnO thin films: Morphological, optical and XPS analysis

出版年份 2016 全文链接

标题

作者

关键词

Ni doped ZnO, Thin films, X-rays diffraction (XRD), X-rays photoelectron spectroscopy (XPS), Photocatalytic, Methyl green dye, Atomic force microscopy (AFM)

出版物

SUPERLATTICES AND MICROSTRUCTURES

Volume 94, Issue -, Pages 108-118

出版商

Elsevier BV

发表日期

2016-04-03

DOI

10.1016/j.spmi.2016.03.043

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