A review of electrical characterization techniques for ultrathin FDSOI materials and devices

标题
A review of electrical characterization techniques for ultrathin FDSOI materials and devices
作者
关键词
-
出版物
SOLID-STATE ELECTRONICS
Volume 117, Issue -, Pages 10-36
出版商
Elsevier BV
发表日期
2015-12-19
DOI
10.1016/j.sse.2015.11.007

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