The influence of interfacial defects on fast charge trapping in nanocrystalline oxide-semiconductor thin film transistors

标题
The influence of interfacial defects on fast charge trapping in nanocrystalline oxide-semiconductor thin film transistors
作者
关键词
-
出版物
SEMICONDUCTOR SCIENCE AND TECHNOLOGY
Volume 31, Issue 5, Pages 055014
出版商
IOP Publishing
发表日期
2016-03-29
DOI
10.1088/0268-1242/31/5/055014

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