Time-of-flight secondary ion mass spectrometry (ToF-SIMS)-based analysis and imaging of polyethylene microplastics formation during sea surf simulation
Time-of-flight secondary ion mass spectrometry (ToF-SIMS)-based analysis and imaging of polyethylene microplastics formation during sea surf simulation
作者
关键词
Microplastics, Particles, Polyethylene, Sea surf simulation, Degradation, Time-of-flight secondary ion mass spectrometry (ToF-SIMS)
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