Morphological, optical and X-ray photoelectron chemical state shift investigations of ZnO thin films
作者
关键词
Chemical state analysis, Atomic layer deposition (ALD), X-ray diffractometer (XRD), X-ray photoelectron spectroscopy (XPS), Field emission scanning electron microscope (FESEM)
Add your recorded webinar
Do you already have a recorded webinar? Grow your audience and get more views by easily listing your recording on Peeref.
Upload NowBecome a Peeref-certified reviewer
The Peeref Institute provides free reviewer training that teaches the core competencies of the academic peer review process.
Get Started